Title of article :
TOF-SIMS study of red sealing-inks on paper and its forensic applications
Author/Authors :
Jihye Lee، نويسنده , , Chiwoo Lee، نويسنده , , Kangbong Lee، نويسنده , , Yeonhee Lee، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2008
Pages :
4
From page :
1523
To page :
1526
Abstract :
Red sealing-ink samples are frequently submitted to forensic laboratories for identification and comparison in a wide variety of criminal and civil cases. The non-destructive identification of sealing-inks on paper is of important to preserve as large an amount of a fraudulent check, forged document, or other such evidence as possible for use in legal proceedings. Time-of-flight secondary ion mass spectrometry (TOF-SIMS) for the analysis of red sealing-inks on paper surfaces was investigated. TOF-SIMS spectra were employed to identify elements and organic compounds in red sealing-inks. An analysis was performed on five sealing-inks of red color manufactured in Korea, Japan, and China. Several fibers from specific sealing-ink sample on paper can be removed leaving little evidence of tampering and can be distinguished from other sealing-inks. Overlapped area of sealing-ink and ballpoint pen in the document was also investigated in order to identify the sequence of recording. Therefore, this study shows that TOF-SIMS is a useful technique for the non-destructive analysis of red sealing-inks on paper.
Keywords :
Questioned document , Forensic science , TOF-SIMS , Sealing-inks
Journal title :
Applied Surface Science
Serial Year :
2008
Journal title :
Applied Surface Science
Record number :
1009873
Link To Document :
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