• Title of article

    A fragment-free ionization technique for organic mass spectrometry with large Ar cluster ions

  • Author/Authors

    Satoshi Ninomiya *، نويسنده , , Yoshihiko Nakata، نويسنده , , Yoshiro Honda، نويسنده , , Kazuya Ichiki، نويسنده , , Toshio Seki، نويسنده , , Takaaki Aoki، نويسنده , , Jiro Matsuo، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2008
  • Pages
    3
  • From page
    1588
  • To page
    1590
  • Abstract
    In this report, we propose to use the incidence of cluster ions that are much larger than molecular ions as a fragment-free ionization technique for organic secondary ion mass spectrometry. Secondary ions were measured for amino acid and peptide targets bombarded with 3, 8 and 13 keV large Ar cluster ions. The relative yields of the fragment ions decreased drastically with increasing incident cluster size. Fragment-free ionization of the molecule was accomplished when large cluster ions with optimized size and energy were incident on a biomolecular sample.
  • Keywords
    Fragment-free ionization , TOF , mass spectrometry , Cluster ion
  • Journal title
    Applied Surface Science
  • Serial Year
    2008
  • Journal title
    Applied Surface Science
  • Record number

    1009890