Author/Authors :
R. Mibuka، نويسنده , , S. Hassaballa، نويسنده , , K. UCHINO، نويسنده , , H. Yurimoto، نويسنده , , R. Todokoro، نويسنده , , K. Kumondai، نويسنده , , M. ISHIHARA، نويسنده ,
Abstract :
Characteristics of the post-ionization using femto-second laser (fs laser) combined with the secondary ion mass spectrometer were investigated. For many metals, ionization saturations were confirmed for the laser power density of >2 × 1013 W/cm2. The characteristic curve of ionization of Ag against the laser power density suggests the occurrence of ionization through the multi-photon resonance excitation. Sensitivity increase after employing the fs laser post-ionization was manifested and a sputtered Cu signal from a minute circular area with a diameter of about 200 nm could be detected clearly.
Keywords :
SNMS , Ga ion beam , Post-ionization , Femto-second laser , Photo-ionization , TOF-SIMS