Title of article
Application of positron beams to the study of positronium-forming solids
Author/Authors
Y. Kobayashi، نويسنده , , K. Ito، نويسنده , , T. Oka، نويسنده , , C. He، نويسنده , , H.F.M. Mohamed، نويسنده , , R. Suzuki، نويسنده , , T. Ohdaira، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2008
Pages
5
From page
174
To page
178
Abstract
Doppler broadening of annihilation radiation (DBAR) and positron annihilation lifetime spectroscopy (PALS) have been successfully applied to the study of positronium (Ps)—forming amorphous solids such as polymers and silicon oxide in the bulk. Implementing depth selectivity to DBAR and PALS by combining them with variable-energy positron beams considerably broadens their applicability. Variation of incident positron energy over a wide range enables depth-profiling, whereas tuning of the beam energy enables the studies of surfaces, interfaces and thin films. In this paper, we discuss fundamentals and applications of energy variable DBAR and PALS for Ps—forming polymers and silicon oxide.
Keywords
Silicon oxide , Positron beam , Lifetime , Positronium , Annihilation radiation , Free volume , Defect , Polymer
Journal title
Applied Surface Science
Serial Year
2008
Journal title
Applied Surface Science
Record number
1010177
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