• Title of article

    Application of positron beams to the study of positronium-forming solids

  • Author/Authors

    Y. Kobayashi، نويسنده , , K. Ito، نويسنده , , T. Oka، نويسنده , , C. He، نويسنده , , H.F.M. Mohamed، نويسنده , , R. Suzuki، نويسنده , , T. Ohdaira، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2008
  • Pages
    5
  • From page
    174
  • To page
    178
  • Abstract
    Doppler broadening of annihilation radiation (DBAR) and positron annihilation lifetime spectroscopy (PALS) have been successfully applied to the study of positronium (Ps)—forming amorphous solids such as polymers and silicon oxide in the bulk. Implementing depth selectivity to DBAR and PALS by combining them with variable-energy positron beams considerably broadens their applicability. Variation of incident positron energy over a wide range enables depth-profiling, whereas tuning of the beam energy enables the studies of surfaces, interfaces and thin films. In this paper, we discuss fundamentals and applications of energy variable DBAR and PALS for Ps—forming polymers and silicon oxide.
  • Keywords
    Silicon oxide , Positron beam , Lifetime , Positronium , Annihilation radiation , Free volume , Defect , Polymer
  • Journal title
    Applied Surface Science
  • Serial Year
    2008
  • Journal title
    Applied Surface Science
  • Record number

    1010177