Title of article :
Ab initio calculation of optical absorption and reflectivity of Si(0 0 1)/SiO2 superlattices with varying interfaces
Author/Authors :
K. Seino، نويسنده , , J.-M. Wagner، نويسنده , , F. Bechstedt، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2008
Pages :
3
From page :
787
To page :
789
Abstract :
Using first-principles calculations we investigate the influence of interface modification and layer thicknesses on the optical properties of Si/SiO2 superlattices. Four interface models with different dangling-bond passivation are considered. The results demonstrate confinement effects not only for the fundamental band gaps but also for the optical properties. While for a large Si layer thickness of the Si/SiO2 superlattices the interface dependence is small, the calculations show a significant structure dependence for thin Si layers. © 2007 Elsevier Science. All rights reserved.
Keywords :
Silicon , Si/SiO2 interface , Optical properties , Nanostructure , Multi-quantum wells
Journal title :
Applied Surface Science
Serial Year :
2008
Journal title :
Applied Surface Science
Record number :
1010364
Link To Document :
بازگشت