• Title of article

    Ab initio calculation of optical absorption and reflectivity of Si(0 0 1)/SiO2 superlattices with varying interfaces

  • Author/Authors

    K. Seino، نويسنده , , J.-M. Wagner، نويسنده , , F. Bechstedt، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2008
  • Pages
    3
  • From page
    787
  • To page
    789
  • Abstract
    Using first-principles calculations we investigate the influence of interface modification and layer thicknesses on the optical properties of Si/SiO2 superlattices. Four interface models with different dangling-bond passivation are considered. The results demonstrate confinement effects not only for the fundamental band gaps but also for the optical properties. While for a large Si layer thickness of the Si/SiO2 superlattices the interface dependence is small, the calculations show a significant structure dependence for thin Si layers. © 2007 Elsevier Science. All rights reserved.
  • Keywords
    Silicon , Si/SiO2 interface , Optical properties , Nanostructure , Multi-quantum wells
  • Journal title
    Applied Surface Science
  • Serial Year
    2008
  • Journal title
    Applied Surface Science
  • Record number

    1010364