Title of article
Angle of incidence effects in a molecular solid
Author/Authors
Kathleen E. Ryan، نويسنده , , Edward J. Smiley، نويسنده , , Nicholas Winograd، نويسنده , , Barbara J. Garrison، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2008
Pages
3
From page
844
To page
846
Abstract
We investigate the influence of the angle of incidence on the sputter yield when bombarding molecular solid, benzene, with C60. Our simulations show that at normal incidence, essentially all of the projectile energy is deposited into the substrate within ∼2.5 nm of the surface. However, at 75° incident angle, only 35% of the projectile energy is deposited within a depth of less than 1.5 nm of the surface while 65% of the projectile energy is reflected. Therefore, important aspects of the collision process which are dependent upon energy deposition, such as sputter yield, ejection depth, and molecule dissociation, may change as the incident angle changes.
Keywords
SIMS , Incident angle , molecular dynamics , Cluster , C60
Journal title
Applied Surface Science
Serial Year
2008
Journal title
Applied Surface Science
Record number
1010378
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