• Title of article

    Monoatomic and cluster beam effect on ToF-SIMS spectra of self-assembled monolayers on gold

  • Author/Authors

    N. Tuccitto، نويسنده , , V. Torrisi، نويسنده , , I. Delfanti، نويسنده , , A. Licciardello، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2008
  • Pages
    3
  • From page
    874
  • To page
    876
  • Abstract
    Self-assembled monolayers represent well-defined systems that is a good model surface to study the effect of primary ion beams used in secondary ion mass spectrometry. The effect of polyatomic primary beams on both aliphatic and aromatic self-assembled monolayers has been studied. In particular, we analysed the variation of the relative secondary ion yield of both substrate metal-cluster (Aun−) in comparison with the molecular ions (M−) and clusters (MxAuy−) by using Bi+, Bi3+, Bi5+ beams. Moreover, the differences in the secondary ion generation efficiency are discussed. The main effect of the cluster beams is related to an increased formation of low-mass fragments and to the enhancement of the substrate related gold-clusters. The results show that, at variance of many other cases, the static SIMS of self-assembled monolayers does not benefit of the use of polyatomic primary ions.
  • Keywords
    Self-assembling process , Monoatomic primary beam , Polyatomic primary beam
  • Journal title
    Applied Surface Science
  • Serial Year
    2008
  • Journal title
    Applied Surface Science
  • Record number

    1010386