Title of article
On the road to high-resolution 3D molecular imaging
Author/Authors
Arnaud Delcorte *، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2008
Pages
5
From page
954
To page
958
Abstract
This contribution reviews the state-of-the-art in the domains of molecular imaging and depth profiling, the two methodological platforms required for 3D molecular imaging by secondary ion mass spectrometric (SIMS). Using molecular dynamics calculations, it also describes some of the mechanisms that make cluster projectiles such as C60 so different for organic sample analysis. The discussion addresses issues that deserve proper attention on the way to 3D molecular imaging in SIMS, such as ultimate lateral resolution, limited molecular yields, chemical effects and damage, and highlights solutions currently in embryo in the many research teams concerned by 3D molecular imaging.
Keywords
Cell , Polymers , Organics , TOF-SIMS , Depth-profiling , Molecular ion , Chemical analysis , Surface characterization , Nanotechnology , SIMS imaging
Journal title
Applied Surface Science
Serial Year
2008
Journal title
Applied Surface Science
Record number
1010408
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