• Title of article

    On the road to high-resolution 3D molecular imaging

  • Author/Authors

    Arnaud Delcorte *، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2008
  • Pages
    5
  • From page
    954
  • To page
    958
  • Abstract
    This contribution reviews the state-of-the-art in the domains of molecular imaging and depth profiling, the two methodological platforms required for 3D molecular imaging by secondary ion mass spectrometric (SIMS). Using molecular dynamics calculations, it also describes some of the mechanisms that make cluster projectiles such as C60 so different for organic sample analysis. The discussion addresses issues that deserve proper attention on the way to 3D molecular imaging in SIMS, such as ultimate lateral resolution, limited molecular yields, chemical effects and damage, and highlights solutions currently in embryo in the many research teams concerned by 3D molecular imaging.
  • Keywords
    Cell , Polymers , Organics , TOF-SIMS , Depth-profiling , Molecular ion , Chemical analysis , Surface characterization , Nanotechnology , SIMS imaging
  • Journal title
    Applied Surface Science
  • Serial Year
    2008
  • Journal title
    Applied Surface Science
  • Record number

    1010408