Title of article :
Energy dependence of projectiles on ion formation in electrospray droplet impact SIMS
Author/Authors :
Daiki Asakawa، نويسنده , , Kunihiko Mori، نويسنده , , Kenzo Hiraoka، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2008
Abstract :
Charged electrospray droplets are introduced in vacuum and are allowed to impact the metal target. The secondary ions generated are measured by an orthogonal time-of-flight mass spectrometer. For the self-assembled monolayer as a sample, the ionization/desorption of monolayer molecules is observed without fragmentation. The secondary ion abundances for various samples deposited on the metal substrate are measured as a function of the acceleration voltage of the projectiles. There are found two threshold behaviors for secondary ion formation, i.e., low-energy and high-energy regimes. In the low-energy regime, desorption of the samples deposited on the metal target starts but no ionization takes place. In the high-energy regime, kinetic energy of the projectile is converted to internal energies for the system taking part in the collision and molecules deposited on the metal substrate are ionized/desorbed. There are found two modes of fragmentation for rhodamine B and crystal violet in the high-energy regime. When N2 was deposited on the metal substrate at ∼17 K, ion signals decreased suddenly. This is due to the drastic change of energy dissipation processes in the high-momentum collision.
Keywords :
SIMS , Shock wave , Electrospray , Cluster , EDI
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science