Author/Authors :
D. Soundararajan، نويسنده , , D. Mangalaraj، نويسنده , , D. Nataraj، نويسنده , , L. Dorosinskii، نويسنده , , J. Santoyo-Salazar، نويسنده , , H.C. Jeon، نويسنده , , T.W. Kang، نويسنده ,
Abstract :
ZnTe and ZnTe:Cr films were prepared on glass substrate by using thermal evaporation method. X-ray diffraction analysis revealed the presence of ZnCrTe phase. X-ray photoelectron spectroscopy was used to estimate the composition of as-prepared films. The valence state of Cr in ZnTe:Cr film is determined to be +2 by using electron spin resonance spectroscopy. Magnetic moment data as a function of magnetic field was recorded by using superconducting quantum interference device magnetometry at 300 K. The result showed a clear hysteresis loop with coercive field of 48 Oe. Magnetic domains were observed by using magnetic force microscopy and the average value of domain size was 3.7 nm.
Keywords :
Dilute magnetic semiconductors , Magnetic domains , ZnTe:Cr film , M–H curve
