Title of article :
Effects of deposition rates on laser damage threshold of TiO2/SiO2 high reflectors
Author/Authors :
Jianke Yao، نويسنده , , Cheng Xu، نويسنده , , Jianyong Ma، نويسنده , , Ming Fang، نويسنده , , Zhengxiu Fan، نويسنده , , Yunxia Jin، نويسنده , , Yuanan Zhao*، نويسنده , , Hongbo He، نويسنده , , Jianda Shao، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2009
Pages :
5
From page :
4733
To page :
4737
Abstract :
TiO2 single layers and TiO2/SiO2 high reflectors (HR) are prepared by electron beam evaporation at different TiO2 deposition rates. It is found that the changes of properties of TiO2 films with the increase of rate, such as the increase of refractive index and extinction coefficient and the decrease of physical thickness, lead to the spectrum shift and reflectivity bandwidth broadening of HR together with the increase of absorption and decrease of laser-induced damage threshold. The damages are found of different morphologies: a shallow pit to a seriously delaminated and deep crater, and the different amorphous-to-anatase-to-rutile phase transition processes detected by Raman study. The frequency shift of Raman vibration mode correlates with the strain in film. Energy dispersive X-ray analysis reveals that impurities and non-stoichiometric defects are two absorption initiations resulting to the laser-induced transformation.
Keywords :
Laser damage , TiO2/SiO2 high reflectors , Electron beam evaporation , Energy dispersive X-ray analysis , Deposition rate , Raman spectra
Journal title :
Applied Surface Science
Serial Year :
2009
Journal title :
Applied Surface Science
Record number :
1011167
Link To Document :
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