Title of article
Massive transfer of vertically aligned Si nanowire array onto alien substrates and their characteristics
Author/Authors
Shu-Chia Shiu، نويسنده , , Shih-Che Hung، نويسنده , , Jiun-Jie Chao، نويسنده , , Ching-Fuh Lin، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2009
Pages
5
From page
8566
To page
8570
Abstract
Si nanowires (NWs) are promising materials for future electronic, photovoltaic, and sensor applications. So far the Si NWs are mainly formed on particular substrates or at high temperatures, greatly limiting their application flexibility. Here we report a low temperature process for forming and massively transferring vertically aligned Si NWs on alien substrates with a large density of about (3–5) × 107 NWs/mm2. The X-ray diffraction spectrum reveals that the transferred NWs exhibit almost the same crystal property as the bulk Si. Our investigation further shows that the transferred NWs have exceptional optical characteristics. The transferred Si NWs of 12.14 μm exhibit the transmittance as low as 0.3% in the near infrared region and 0.07% in the visible region. The extracted absorption coefficient of Si NWs in the near infrared region is about 3 × 103 cm−1, over 30 times larger than that of the bulk Si. Because of the low temperature process, it enables a large variety of alien substrates such as glass and plastics to be used. In addition, the exceptional properties of the transferred NWs offer potential applications for photovoltaic, photo-detectors, sensors, and flexible electronics.
Keywords
transfer , X-ray diffraction , Silicon nanowire , Optical absorption
Journal title
Applied Surface Science
Serial Year
2009
Journal title
Applied Surface Science
Record number
1012127
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