Title of article
Towards chemical state resolution in regularized depth profiles derived from ARXPS data taken on plasma-oxidized polystyrene
Author/Authors
R.W. Paynter، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2009
Pages
5
From page
8738
To page
8742
Abstract
ARXPS data obtained from a plasma-oxidized polystyrene sample were evaluated by means of 3-parameter and 10-parameter depth profile models, with and without regularization. It was found that the partially regularized 3-parameter model gave equivalent results compared to the regularized 10-parameter model, but requiring one fifteenth of the computational effort.
Keywords
Polymer surface , Tikhonov regularization , Angle-resolved X-ray photoelectron spectroscopy
Journal title
Applied Surface Science
Serial Year
2009
Journal title
Applied Surface Science
Record number
1012158
Link To Document