Author/Authors :
V. Kisand، نويسنده , , U. Joost، نويسنده , , V. Reedo، نويسنده , , R. P?rna، نويسنده , , T. T?tte، نويسنده , , J. Shulga، نويسنده , , A. Saar، نويسنده , , L. Matisen، نويسنده , , A. Kikas، نويسنده , , I. Kink، نويسنده ,
Abstract :
Formation and properties of nickel doped TiO2 films prepared by sol–gel method were studied using X-ray photoelectron spectroscopy, X-ray diffraction, atomic force microscopy, and energy dispersive X-ray analysis. The results demonstrate that sizes of TiO2 crystallites increase with increasing heating temperature. Also, at temperatures above 800 image C diffusion of nickel onto the surfaces results in increased concentrations of nickel compounds on the surfaces. Similar to pure TiO2 films the light-induced modification of hydrophilicity is observed also in the case of nickel doped TiO2 films.
Keywords :
Titanium oxide , Sol–gel films , XPS , nickel