• Title of article

    Origin of HfO2/GaAs interface states and interface passivation: A first principles study

  • Author/Authors

    Weichao Wang، نويسنده , , Ka Xiong، نويسنده , , Geunsik Lee، نويسنده , , Min Huang، نويسنده , , Robert M. Wallace، نويسنده , , Kyeongjae Cho، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2010
  • Pages
    5
  • From page
    6569
  • To page
    6573
  • Abstract
    First principles calculations of HfO2/GaAs interfaces indicate that the interface states originate from the charge mismatch between HfO2 and GaAs surfaces. We find that a model neutral interface (HfO2 and GaAs surfaces terminated with two O and one Ga atoms per surface unit cell) removes gap states due to the balance of the interface charge. F and H can neutralize the HfO2/GaAs interface resulting in useful band offsets, thus becoming possible candidates to passivate the interface states.
  • Keywords
    HfO2/GaAs interface , Fermi level pinning , Electronegativity (EN)
  • Journal title
    Applied Surface Science
  • Serial Year
    2010
  • Journal title
    Applied Surface Science
  • Record number

    1013071