Title of article
Origin of HfO2/GaAs interface states and interface passivation: A first principles study
Author/Authors
Weichao Wang، نويسنده , , Ka Xiong، نويسنده , , Geunsik Lee، نويسنده , , Min Huang، نويسنده , , Robert M. Wallace، نويسنده , , Kyeongjae Cho، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2010
Pages
5
From page
6569
To page
6573
Abstract
First principles calculations of HfO2/GaAs interfaces indicate that the interface states originate from the charge mismatch between HfO2 and GaAs surfaces. We find that a model neutral interface (HfO2 and GaAs surfaces terminated with two O and one Ga atoms per surface unit cell) removes gap states due to the balance of the interface charge. F and H can neutralize the HfO2/GaAs interface resulting in useful band offsets, thus becoming possible candidates to passivate the interface states.
Keywords
HfO2/GaAs interface , Fermi level pinning , Electronegativity (EN)
Journal title
Applied Surface Science
Serial Year
2010
Journal title
Applied Surface Science
Record number
1013071
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