Title of article :
Structural and morphological study of ZnO thin films electrodeposited on n-type silicon
Author/Authors :
N. Ait Ahmed، نويسنده , , G. Fortas، نويسنده , , H. Hammache، نويسنده , , S. Sam، نويسنده , , A. Keffous، نويسنده , , A. Manseri، نويسنده , , L. Guerbous، نويسنده , , N. Gabouze*، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2010
Abstract :
In this work, we report on the electrodeposition of ZnO thin films on n-Si (1 0 0) and glass substrates. The influence of the deposition time on the morphology of ZnO thin films was investigated. The ZnO thin films were characterized by X-ray diffraction (XRD), energy dispersive X-ray (EDS) and scanning electron microscopy (SEM). The results show a variation of ZnO texture from main (0 0 2) at 10 min to totally (1 0 1) at 15 min deposition time. The photoluminescence (PL) studies show that both UV (∼382 nm) and blue (∼432 nm) luminescences are the main emissions for the electrodeposited ZnO films. In addition, the film grown at 15 min indicates an evident decrease of the yellow-green (∼520 nm) emission band comparing with that of 10 min. Finally, transmittance spectra show a high transmission value up to 85% in the visible wavelength range. Such results would be very interesting for solar cells applications.
Keywords :
Silicon , Morphology , Electrodeposition , Zinc oxide , diffraction
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science