Title of article :
Adhesion experiments using an AFM—Parameters of influence
Author/Authors :
Olavio Dos Santos Ferreira، نويسنده , , Edwin Gelinck، نويسنده , , Dennis de Graaf، نويسنده , , Jürgen Hartmut Fischer، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2010
Abstract :
Adhesion measurements were performed by AFM (Atomic Force Microscopy). It was shown that many parameters need to be controlled in order to provide reproducible and quantitative results. Adhesion forces were shown to depend on combination of materials characteristics and testing geometry as well as experimental protocol (contact time, contact force and contact area). This contact area was modified by means of FIB (Focused Ion Beam) milling and deliberate abrasion. As a result, a drastic change in adhesion could be observed. Still, those are problems connected to adjustment of interacting surfaces.
Keywords :
AFM , Tip modification , Abrasion tip , Contact time , Adhesion , FIB , Contact area
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science