Title of article :
Improved color purity and electroluminescent efficiency obtained by modulating thicknesses and evaporation rates of hole block and electron transport layers
Author/Authors :
Jiong-liang Zhou، نويسنده , , Ruiping Deng، نويسنده , , Jing Feng، نويسنده , , Xiaona Li، نويسنده , , Xiyan Li، نويسنده , , Hongjie Zhang، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2011
Abstract :
In this work, a series of electroluminescent (EL) devices based on trivalent europium (Eu3+) complex Eu(TTA)3phen (TTA = thenoyltrifluoroacetone, phen = 1,10-phenanthroline) were fabricated by selecting 2,9-dimethyl-4,7-diphenyl-1,10-phenanthroline (BCP) and tris(8-hydroxyquinoline) aluminum (Alq3) as hole block and electron transport materials, respectively. Interestingly, we found the transport of electrons decreases gradually with increasing thicknesses and evaporation rates of BCP and Alq3 layers. Analyzing carrier distribution and EL spectra, we conclude that appropriately modulating the thicknesses and evaporation rates is an efficient way to decrease the accumulation of electrons in HBL, thus suppressing the EL of hole block material. On the other hand, decreasing the transport of electrons can also facilitate the balance of holes and electrons on Eu(TTA)3phen molecules, thus further enhancing the EL efficiency. As a result, pure Eu3+ emission with the efficiency as high as 8.49 cd/A was realized by controlling the thicknesses and evaporation rates of BCP and Alq3 layers to be 30 nm and 0.10 nm/s, 40 nm and 0.10 nm/s, respectively.
Keywords :
Color purity , Electron accumulation , Recombination zone , Hole penetration
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science