Author/Authors :
Wenlong Yang، نويسنده , , Zhongxiang Zhou، نويسنده , , Bin Yang، نويسنده , , Yongyuan Jiang، نويسنده , , Hao Tian، نويسنده , , Dewei Gong، نويسنده , , Hongguo Sun، نويسنده , , Wen Chen، نويسنده ,
Abstract :
Pure perovskite phase and crack-free KTa0.5Nb0.5O3 thin films were prepared on Pt/Ti/SiO2/Si substrates by pulsed laser deposition. The structure and orientation were analyzed by X-ray diffraction. The optical properties were investigated by an ellipsometer. The relationship between the refractive index dispersive behavior and internal structure was analyzed by Sellmeier dispersion model and single electronic oscillator approximation. The parameters of room temperature monomial Sellmeier oscillator were calculated. And the refractive index dispersive parameter E0/S0 of KTa0.5Nb0.5O3 thin films on Pt/Ti/SiO2/Si substrates is (6.72 ± 0.04) × 10−14 eV m2, which is consistent with those of KTN crystals and compounds with ABO3 perovskite type structure.
Keywords :
structure , Refractive index dispersion , Sellmeier oscillator approximation , Pulsed laser deposition , Potassium niobate tantalate film