Title of article :
Structural characterization of a Cu(II) thin-film aging in a Cu-nitrate solution
Author/Authors :
F.O. Méar، نويسنده , , M. Essi، نويسنده , , P. Sistat، نويسنده , , M.-F. Guimon، نويسنده , , D. Gonbeau، نويسنده , , A. Pradel، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2009
Abstract :
The response of thin-film copper (II) ion-selective electrodes based on chalcogenide glassy Cu–Sb–Ge–Se is described according to the soaking time in a 10−4 M copper (II) solution. The chalcogenide membrane/solution interface has been investigated by using electrochemical impedance spectroscopy (EIS) and X-ray photoelectron spectroscopy (XPS) in order to understand the sensing properties. During the first month of the soaking, an alteration of the membrane by a chemical change without alteration of the sensor detection performance has been observed.
Keywords :
Ion-selective electrode (ISE) , Chalcogenide membrane , Electrochemical impedance spectroscopy (EIS) , X-ray photoelectron spectroscopy (XPS) , Thin-film
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science