Title of article :
Effect of molecular structure on bias stress effect in organic thin-film transistors
Author/Authors :
A.K. Diallo، نويسنده , , F. Fages، نويسنده , , F. Serein-Spirau، نويسنده , , J.-P. Lere-Porte، نويسنده , , C. Videlot-Ackermann، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2011
Abstract :
Two thiophene-phenylene semiconductors, bis(2-phenylethynyl) end-substituted oligothiophenes (diPhAc-nTs, n = 2, 3), were studied as active layers in organic thin film transistors (OTFTs). Structural and electrical properties of such high vacuum evaporated thin films were compared to pentacene. All three oligomers behave as p-type semiconducting layers into OTFTs. In the same preparation and measurement conditions, diPhAc-3T possesses two of incontrovertible attributes of OTFTs for low cost applications, a high air-stable mobility at low substrate temperature (Tsub), i.e. typically 25 °C together with a reduced bias stress effect compared to the well-known pentacene semiconductor. This study brings to light on the role of the molecular structure involved in the active layer in thin-film devices and describes effects as thin film morphology as important parameters when optimizing the structure of OTFTs.
Keywords :
oligomers , Thin films , Transistors , Bias stress effect
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science