Title of article :
Measuring relatedness between technological fields
Author/Authors :
Si Hyung Joo، نويسنده , , Yeonbae Kim، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2010
Pages :
20
From page :
435
To page :
454
Abstract :
Intensified technology convergence, increasing relatedness between technological fields, is a mega-trend in 21st century science and technology. However, scientometrics has been unsuccessful in identifying this techno-economic paradigm change. To address the limitations and validity problems of conventional measures of technology convergence, we introduce a multi-dimensional contingency table representation of technological field co-occurrence and a relatedness measure based on the Mantel–Haenszel common log odds ratio. We used Korean patent data to compare previous and proposed methods. Results show that the proposed method can increase understanding of the techno-economic paradigm change because it reveals significant changes in technological relatedness over time.
Journal title :
Scientometrics
Serial Year :
2010
Journal title :
Scientometrics
Record number :
1015738
Link To Document :
بازگشت