Title of article
High energy ion scattering and recoil spectrometry in applied materials science
Author/Authors
L.J. van IJzendoorn، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1994
Pages
18
From page
55
To page
72
Abstract
The fundamentals of high energy ion scattering and recoil spectrometry (possibly combined with channelling) are discussed in relation to the accuracies required for materials science studies and in relation to characteristics of competing surface analysis techniques. The extreme versatility of ion scattering techniques is demonstrated by a survey through many application areas in materials science ranging from plastics to oxidic insulators, semiconductors and metals.
Keywords
Surface techniques , High energy ion scattering , Recoil spectrometry , Materials science
Journal title
Analytica Chimica Acta
Serial Year
1994
Journal title
Analytica Chimica Acta
Record number
1022145
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