Title of article :
Semi-quantitative panoramic analysis of industrial samples by inductively coupled plasma mass spectrometry
Author/Authors :
Y Hu، نويسنده , , F Vanhaecke، نويسنده , , L Moens، نويسنده , , R Dams، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1997
Pages :
7
From page :
105
To page :
111
Abstract :
Inductively coupled plasma mass spectrometry is shown to be ideally suited as a survey tool, allowing semi-quantitative determination of over 70 elements in less than 3 min. This semi-quantitative panoramic survey ability was demonstrated using three certified reference materials of different origin. The accuracy of the results obtained is well within ±50% of the corresponding certified values. For most of the elements, the detection limit is well below 1 μg/l. The main difficulties encountered are spectral interferences and matrix-induced signal suppression. Finally, using a simple analysis protocol and practical ways to overcome matrix effects and spectral interferences encountered, a number of different samples from industrial origin were successfully analysed, as was illustrated using recovery experiments.
Keywords :
Semi-quantitative analysis , Inductively coupled plasma mass spectrometry , Multi-element analysis
Journal title :
Analytica Chimica Acta
Serial Year :
1997
Journal title :
Analytica Chimica Acta
Record number :
1024855
Link To Document :
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