Title of article :
Determination of trace elements in organic matrices by grazing-emission X-ray fluorescence spectrometry Original Research Article
Author/Authors :
Z.M. Spolnik، نويسنده , , M. Claes، نويسنده , , R. van Grieken، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Abstract :
Grazing-emission X-ray fluorescence spectrometry (GEXRF) was used for the determination of trace amounts of Na, Zn and Pb in an organic matrix. Special attention was paid to deposit sample layers with a thickness below a certain critical level, on polycarbonate carriers, in order to avoid matrix effects and to obtain straight calibration curves. Detection limits (DL’s) for a low-Z element (Na), a medium-Z element (Zn) and a heavy-Z element (Pb) in such kind of material are calculated and amount to 0.4, 1.5 and 2 ng, respectively. In order to demonstrate the simplicity by which trace elements in organic material can be analysed with GEXRF, the analysis of beer samples was performed.
Keywords :
Internal standard , Detection limit , Grazing-emission X-ray fluorescence spectrometry , Critical thickness
Journal title :
Analytica Chimica Acta
Journal title :
Analytica Chimica Acta