Title of article :
Long-term testing in a short-term world
Author/Authors :
V.T.، Rokosz, نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
-63
From page :
64
To page :
0
Abstract :
Accelerated stress testing reduces the time required to test a system but can be hard to apply to functions running on a fixed schedule. This article describes how to accelerate the testing of scheduled functions by triggering them through automated tests, either by periodically advancing the system clock or through a programmatic event interface. With this method, the accelerated stress tests donʹt distort the systemʹs operational profile.
Keywords :
developable surface , electromagnetic scattering , Physical optics , radar backscatter
Journal title :
IEEE SOFTWARE
Serial Year :
2003
Journal title :
IEEE SOFTWARE
Record number :
103574
Link To Document :
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