• Title of article

    Long-term testing in a short-term world

  • Author/Authors

    V.T.، Rokosz, نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2003
  • Pages
    -63
  • From page
    64
  • To page
    0
  • Abstract
    Accelerated stress testing reduces the time required to test a system but can be hard to apply to functions running on a fixed schedule. This article describes how to accelerate the testing of scheduled functions by triggering them through automated tests, either by periodically advancing the system clock or through a programmatic event interface. With this method, the accelerated stress tests donʹt distort the systemʹs operational profile.
  • Keywords
    developable surface , electromagnetic scattering , Physical optics , radar backscatter
  • Journal title
    IEEE SOFTWARE
  • Serial Year
    2003
  • Journal title
    IEEE SOFTWARE
  • Record number

    103574