Title of article :
Electric measurements by AFM on silicon nanocrystals
Author/Authors :
S Decossas، نويسنده , , F Mazen، نويسنده , , T Baron، نويسنده , , A Souifi، نويسنده , , G Brémond، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2003
Abstract :
Scanning capacitance microscopy (SCM) has been used to characterize Silicon nanocrystals (Si-nc) embedded in Silicon oxide. Our experimental approach is based on the charging of the surface by the AFM tip and its effect on SCM measurements. We then present SCM measurements that show electrical contrast on one single Si-nc.
Keywords :
SCM , Silicon nanocrystals , AFM
Journal title :
Physica E Low-dimensional Systems and Nanostructures
Journal title :
Physica E Low-dimensional Systems and Nanostructures
