Title of article
Electric measurements by AFM on silicon nanocrystals
Author/Authors
S Decossas، نويسنده , , F Mazen، نويسنده , , T Baron، نويسنده , , A Souifi، نويسنده , , G Brémond، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2003
Pages
3
From page
543
To page
545
Abstract
Scanning capacitance microscopy (SCM) has been used to characterize Silicon nanocrystals (Si-nc) embedded in Silicon oxide. Our experimental approach is based on the charging of the surface by the AFM tip and its effect on SCM measurements. We then present SCM measurements that show electrical contrast on one single Si-nc.
Keywords
SCM , Silicon nanocrystals , AFM
Journal title
Physica E Low-dimensional Systems and Nanostructures
Serial Year
2003
Journal title
Physica E Low-dimensional Systems and Nanostructures
Record number
1046199
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