Abstract :
It is well known that in 1D the cross section of a point scatterer increases along with the scattererʹs strength (potential). In this paper we show that this is an exceptional case, and for lower or higher number of dimensions, i.e., 0
Keywords :
Point impurities , Defects eigenstates , Scattering by defects , Impurities in thin films
Journal title :
Physica E Low-dimensional Systems and Nanostructures
Journal title :
Physica E Low-dimensional Systems and Nanostructures