Title of article :
Impurity scattering effects on transport through gate-all-around Si nanowires
Author/Authors :
Jung Hyun Oh، نويسنده , , D. Ahn، نويسنده , , S.W. Hwang، نويسنده , , J.S. Hwang، نويسنده , , M.H. Son، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2008
Abstract :
We investigate effects of impurity scattering on current–voltage characteristics in a gate-all-around Si nanowire theoretically. Using non-equilibrium Greenʹs function technique, the self-energy for the impurity scattering is incorporated under the self-consistent Born approximation. We show that the impurity scattering changes the electronic structure of the Si nanowire largely and, thus, results in very different current–voltage curves compared to the case of the free-impurity scattering.
Keywords :
Impurity scattering , Nanowire transistor , Greenיs function
Journal title :
Physica E Low-dimensional Systems and Nanostructures
Journal title :
Physica E Low-dimensional Systems and Nanostructures