Title of article
Radio-frequency reflectometry—A fast and sensitive measurement method for two-dimensional systems
Author/Authors
L.J. Taskinen، نويسنده , , R.P. Starrett، نويسنده , , T.P. Martin، نويسنده , , J.C.H. Chen، نويسنده , , A.P. Micolich، نويسنده , , A.R. Hamilton، نويسنده , , M.Y. Simmons، نويسنده , , D.A. Ritchie، نويسنده , , M. Pepper، نويسنده ,
Issue Information
ماهنامه با شماره پیاپی سال 2009
Pages
4
From page
1192
To page
1195
Abstract
We have used radio-frequency (rf) reflectometry for sensitive, large bandwidth measurements of two-dimensional (2D) systems in AlGaAs/GaAs heterostructures at millikelvin temperatures. We show that the sample geometry is important in explaining the rf response of the circuit. Our simple lumped element model, where the gated 2D system is described as a resistive transmission line, qualitatively agrees with the experimental findings.
Keywords
Reflectometry , Two-dimensional systems , Radio-frequency
Journal title
Physica E Low-dimensional Systems and Nanostructures
Serial Year
2009
Journal title
Physica E Low-dimensional Systems and Nanostructures
Record number
1048149
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