Noise performance of the radio-frequency single-electron transistor

We have operated a single-electron transistor (SET) in the radio-frequency mode. In this way both the bandwidth and the sensitivity of the traditional SET can be increased several orders of magnitude. By optimizing the system we reached a best sensitivity of View the MathML source. We use this system to study charge noise up to View the MathML source and to demonstrate pulsed, short-time measurements of charge.