Title of article :
The Hall effect in a-GdxSi1−x at the metal–insulator transition
Author/Authors :
W. Teizer، نويسنده , , F. Hellman، نويسنده , , R.C. Dynes، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2003
Pages :
4
From page :
266
To page :
269
Abstract :
We have measured the Hall effect in 3-d amorphous GdxSi1−x films in the critical regime of the metal–insulator transition (MIT) at View the MathML source. a-GdxSi1−x exhibits a large negative magnetoresistance which is independent of the orientation of the magnetic field H with respect to the film and allows an in situ tuning of the conductivity through the MIT with H. We find an electron-like Hall coefficient RH. As the material becomes less metallic, RH increases. We find that RH is a critical quantity with critical exponent View the MathML source.
Keywords :
localization , Hall effect , correlation , Metal–insulator transition
Journal title :
Physica E Low-dimensional Systems and Nanostructures
Serial Year :
2003
Journal title :
Physica E Low-dimensional Systems and Nanostructures
Record number :
1050758
Link To Document :
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