Title of article :
Correlation between Er3+ emission and Si clusters in Erbium-doped a-SiOx:H films
Author/Authors :
C.Y. Chen، نويسنده , , W.D. Chen، نويسنده , , S.F. Song، نويسنده , , Z.J. Xu، نويسنده , , X.B. Liao، نويسنده , , Guohua Li، نويسنده , , L.F. Bian، نويسنده , , Kun Ding، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2005
Pages :
5
From page :
21
To page :
25
Abstract :
Erbium-doped hydrogenated amorphous silicon suboxide films containing silicon clusters (a-SiOx:H) were prepared. The samples exhibited photoluminescence (PL) peaks at around 750 nm and 1.54 μm, which could be assigned to the electron–hole recombination in silicon clusters and the intra-4f transition in Er3+, respectively. We compared annealing behaviors of Si clusters and Er3+ emission and found that Si clusters emission depends strongly upon crystallinity of Si clusters, whereas Er3+ emission is not sensitive to whether it is Si nanocrystals (nc-Si) or amorphous Si (a-Si) clusters. The erbium-doped a-SiOx:H films containing either a-Si clusters or nc-Si have the same kind of Er3+-emitting centers. Based on these results, it is concluded that a-Si clusters can play the same role on Er3+ excitation as nc-Si.
Keywords :
Si clusters , Erbium , Emission
Journal title :
Physica E Low-dimensional Systems and Nanostructures
Serial Year :
2005
Journal title :
Physica E Low-dimensional Systems and Nanostructures
Record number :
1051602
Link To Document :
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