Effective resolution of analog to digital converters

ADCs have always been bottlenecks in electronic systems. Currently, ADCs are often integrated on a semiconductor substrate with other mixed-signal circuits. This creates a need for clever strategies for error measurement and correction. This paper describes an analytical method which allows implementation of the necessary test on-cell. The main requirement is to produce a high-quality sine wave on the board. The parameters of this effective resolution measurement procedure can be easily (in real time) accumulated by typical digital circuitry.