Title of article
DIELECTRIC CONSTANT MEASUREMENT FOR THIN MATERIAL AT MICROWAVE FREQUENCIES
Author/Authors
By B.-K. Chung ، نويسنده ,
Issue Information
ماهنامه با شماره پیاپی سال 2007
Pages
14
From page
239
To page
252
Abstract
Apractical problem in the reflection method for dielectric constant measurement is the difficulty to ensure the sample is placed exactly at the waveguide flange. Asmall position offset of the dielectric sample will give rise to some errors in calculating
Journal title
Progress In Electromagnetics Research
Serial Year
2007
Journal title
Progress In Electromagnetics Research
Record number
1054478
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