• Title of article

    EXPERIMENTAL STUDY AND SPICE SIMULATION OF CMOS INVERTERS LATCH-UP EFFECTS DUE TO HIGH POWER MICROWAVE INTERFERENCE

  • Author/Authors

    By H. Wang، نويسنده , , J. Li، نويسنده , , H. Li، نويسنده , , K. Xiao، نويسنده , , and H. Chen ، نويسنده ,

  • Issue Information
    ماهنامه با شماره پیاپی سال 2008
  • Pages
    18
  • From page
    313
  • To page
    330
  • Abstract
    Experimental study and SPICE simulation of CMOS digital circuits latch-up effects due to high power microwave interference are reported in this paper. As a traditional inherent destruction phenomenon, latch-up effect may jeopardize the correct function of
  • Journal title
    Progress In Electromagnetics Research
  • Serial Year
    2008
  • Journal title
    Progress In Electromagnetics Research
  • Record number

    1054815

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=1054815