Title of article :
EXPERIMENTAL STUDY AND SPICE SIMULATION OF CMOS INVERTERS LATCH-UP EFFECTS DUE TO HIGH POWER MICROWAVE INTERFERENCE
Author/Authors :
By H. Wang، نويسنده , , J. Li، نويسنده , , H. Li، نويسنده , , K. Xiao، نويسنده , , and H. Chen ، نويسنده ,
Issue Information :
ماهنامه با شماره پیاپی سال 2008
Abstract :
Experimental study and SPICE simulation of CMOS digital circuits latch-up effects due to high power microwave interference are reported in this paper. As a traditional inherent destruction phenomenon, latch-up effect may jeopardize the correct function of
Journal title :
Progress In Electromagnetics Research
Journal title :
Progress In Electromagnetics Research
