BROADBAND MEASUREMENTS OF DIELECTRIC PROPERTIES OF LOW-LOSS MATERIALS AT HIGH TEMPERATURES USING CIRCULAR CAVITY METHOD
Author/Authors :
By E. Li، نويسنده , , Z.-P. Nie، نويسنده , , G. Guo، نويسنده , , Q. Zhang، نويسنده , , Z. Li، نويسنده , , and F. He ، نويسنده ,
Issue Information :
ماهنامه با شماره پیاپی سال 2009
Pages :
18
From page :
103
To page :
120
Abstract :
We describe a broadband microwave test system that can measure dielectric properties of microwave low-loss materials at high temperatures using circular cavity method. The dielectric constants and loss tangents of samples at different temperatures were ca
