Author/Authors :
S. Han، نويسنده , , J.Y. Zhang، نويسنده , , Z.Z. Zhang، نويسنده , , Y.M. Zhao، نويسنده , , D.Y. Jiang، نويسنده , , Z.G. Ju، نويسنده , , D.Z. Shen، نويسنده , , D.X. Zhao، نويسنده , , B. Yao، نويسنده ,
Abstract :
MgZnO thin films were deposited on c-plane sapphire and fused quartz substrates with the same growth parameters by rf-reactive magnetron sputtering. Both the MgZnO thin films on the two substrates are single hexagonal phase and show similar Mg content. However, the absorption edge of MgZnO thin film on sapphire substrate shows a blue shift compared with that on fused quartz substrate. Similar shift also appears in the photoresponse of the detectors based on them. These phenomena were attributed to the more Mg atoms in grain boundary caused by the smaller grain size in MgZnO film on fused quartz substrate.
Keywords :
Blue shift , MgZnO , rf-sputtering , Substrate
