Tetravalent ions substitution in Cu – ferrite; structure formation and electrical properties

The structure and formation of the two systems of mixed ferrites Cu1+xGexFe2−2xO4 and Cu1+xTixFe2−2xO4 (where x = 0.0, 0.2, 0.3 and 0.4) were studied using X-ray diffraction (XRD) and IR absorption analysis. The X-ray analysis indicates that the samples of x = 0 (CuFe2O4) and x = 0.1 of Cu–Ti system were formed in tetragonal structure with lattice parameters a = 0.830 nm and c = 0.854 nm, respectively. All other samples of the two systems were formed in cubic symmetry with constant lattice parameter. For Cu–Ge ferrite the lattice parameter (a) equals 0.837 nm while it equals 0.840 nm for the system of Cu–Ti ferrite.