Title of article
XPS and SEM studies of chromium oxide films chemically formed on stainless steel 316 L
Author/Authors
P Stefanov، نويسنده , , D Stoychev، نويسنده , , M Stoycheva، نويسنده , , Ts. Marinova، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2000
Pages
4
From page
212
To page
215
Abstract
The structure and composition of chromium oxide films formed on stainless steel by immersion in a chromium electrolyte have been studied by SEM and XPS. Cr2O3 crystallites in the range 30–150 nm are fully developed and cover the whole surface. The chemical composition in the depth and the thickness of the oxide layer have been determined by XPS sputter profiles. The oxide film can be described within the framework of a double layer consisting of a thin outer hydrated layer and an inner layer of Cr2O3.
Keywords
Oxidation , Stainless steel , Depth profiles
Journal title
Materials Chemistry and Physics
Serial Year
2000
Journal title
Materials Chemistry and Physics
Record number
1060320
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