Title of article :
Small angle X-ray scattering and electrical resistivity measurements on an Al–2Li–5Mg–0.1Zr alloy
Author/Authors :
C.T. Truong، نويسنده , , O. Kabisch، نويسنده , , W. Gille، نويسنده , , U. Schmidt، نويسنده ,
Issue Information :
ماهنامه با شماره پیاپی سال 2002
Abstract :
The growth of δ′ particles in an Al–2Li–5Mg–0.1Zr (wt.%) alloy was studied by means of electrical resistivity and small angle X-ray scattering measurements. The particle development in the ageing temperature interval studied obeys the growth law. Criteria of the coarsening process of the δ′ phase were examined. The activation energy for the coarsening process was determined to be 1.34±0.02 eV.
Keywords :
Al–Li alloy , Ageing process , Small angle X-ray scattering , Ostwald ripening , Activation energy , Electrical resistivity
Journal title :
Materials Chemistry and Physics
Journal title :
Materials Chemistry and Physics
