Title of article
Small angle X-ray scattering and electrical resistivity measurements on an Al–2Li–5Mg–0.1Zr alloy
Author/Authors
C.T. Truong، نويسنده , , O. Kabisch، نويسنده , , W. Gille، نويسنده , , U. Schmidt، نويسنده ,
Issue Information
ماهنامه با شماره پیاپی سال 2002
Pages
6
From page
268
To page
273
Abstract
The growth of δ′ particles in an Al–2Li–5Mg–0.1Zr (wt.%) alloy was studied by means of electrical resistivity and small angle X-ray scattering measurements. The particle development in the ageing temperature interval studied obeys the growth law. Criteria of the coarsening process of the δ′ phase were examined. The activation energy for the coarsening process was determined to be 1.34±0.02 eV.
Keywords
Al–Li alloy , Ageing process , Small angle X-ray scattering , Ostwald ripening , Activation energy , Electrical resistivity
Journal title
Materials Chemistry and Physics
Serial Year
2002
Journal title
Materials Chemistry and Physics
Record number
1060753
Link To Document