Title of article :
Surface roughness factor of anodic oxide layer for electrolytic capacitors
Author/Authors :
Han-Jun Oh، نويسنده , , Gyeong-Su Park، نويسنده , , Jung-Gu Kim، نويسنده , , Yongsoo Jeong، نويسنده , , Choong-Soo Chi، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2003
Abstract :
The roughness factor of barrier-type anodic oxide layer with low electrical conductivity was evaluated using electrochemical measurement in electrolyte with redox couple. To evaluate the surface roughness factor, the surface of barrier-type oxide layer was covered with thin layer of platinum by sputtering. From the limiting diffusion current method the surface roughness factor of barrier-type Al2O3 estimated to be 1.03. This factor is in good agreement with the results of the cross-sectional characteristics by using transmission electron microscope.
Keywords :
Electrochemical techniques , Aluminum oxide , Dielectric properties , Capacitance
Journal title :
Materials Chemistry and Physics
Journal title :
Materials Chemistry and Physics