Title of article :
Spray pyrolysis deposition of lanthanum telluride thin films and their characterizations
Author/Authors :
G.D Bagde، نويسنده , , S.D Sartale، نويسنده , , C.D. Lokhande، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2005
Pages :
4
From page :
402
To page :
405
Abstract :
Spray pyrolysis method is used to deposit lanthanum telluride (La2Te3) thin films on glass substrates. The films are deposited by pyrolysis of sprayed solutions of LaCl3 and Te metal dissolved in concentrated HCl and HNO3 along with hydrazine hydrate as a reducing agent. X-ray diffraction analyses show that the films are polycrystalline with La2Te3 phase. The films have a direct optical band gap of 2.2 eV. The films are p-type semiconductors with an electrical resistivity of the order of 104 Ω cm at ambient temperature (27 °C).
Keywords :
La2Te3 , X-ray diffraction , Optical absorption , Thermoemf , Spray pyrolysis , Resistivity
Journal title :
Materials Chemistry and Physics
Serial Year :
2005
Journal title :
Materials Chemistry and Physics
Record number :
1063046
Link To Document :
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