Title of article
Growth morphology of {1 1 0} faces of manganese mercury thiocyanate crystals investigated by atomic force microscopy
Author/Authors
Y.L. Geng، نويسنده , , D. Xu، نويسنده , , C.H. Zhang and X.Q. Wang، نويسنده , , W. Du، نويسنده , , H.Y. Liu، نويسنده , , G.H. Zhang a، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2006
Pages
4
From page
188
To page
191
Abstract
Atomic force microscopy is employed to investigate the surface morphology of the {1 1 0} faces of MMTC crystals grown at 40 °C at a supersaturation of σ = 0.5. Growth hillocks generated by dislocation sources often appear in groups, which leads to faster growth of the local area and forming layers with large height difference up to 30 nm. Growth centers operate nearly equally during the growth process. Serried and sparse monolayer steps dominate alternately on the surface, which is thought to be distinct phenomenon of the two-metal-centered complex compounds family.
Keywords
Growth morphology , atomic force microscopy , MMTC crystals , Elementary steps
Journal title
Materials Chemistry and Physics
Serial Year
2006
Journal title
Materials Chemistry and Physics
Record number
1064138
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