Title of article
XPS study of InTe and GaTe single crystals oxidation
Author/Authors
O.A. Balitskii *، نويسنده , , W. Jaegermann، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2006
Pages
4
From page
98
To page
101
Abstract
Using X-ray photoelectron spectroscopy (XPS) thermal oxidation of indium and gallium tellurides single crystals was studied. It was established, that oxidation produces layers of both metal and tellurium oxides on the surface, which drastically differs from indium and gallium sulphides and selenides own oxides. Possibility of formation of the other tellurium containing phases is discussed.
Keywords
Oxidation , X-ray photo-emission spectroscopy (XPS) , Indium and gallium tellurides
Journal title
Materials Chemistry and Physics
Serial Year
2006
Journal title
Materials Chemistry and Physics
Record number
1064264
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