Title of article :
Direct current sputtered aluminum-doped zinc oxide films for thin crystalline silicon heterojunction solar cell
Author/Authors :
Yu Qiu، نويسنده , , Henrico Hermawan، نويسنده , , Ivan Gordon، نويسنده , , Jef Poortmans، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2013
Pages :
8
From page :
744
To page :
751
Abstract :
The high-power high-throughput direct current (DC) magnetron sputtering of aluminum-doped zinc oxide (AZO) film was investigated for fabricating amorphous silicon/crystalline silicon heterojunction solar cells. The AZO films were deposited using 1.0 wt.% and 2.0 wt.% Al-doped ZnO targets. The functional properties of the deposited films were characterized by measuring the electrical conductivity, Hall mobility, free carrier density and optical transparency. The influence of the sputtering power, oxygen concentration, substrate temperature, post-annealing and film thickness on the film properties were studied systematically. The oxygen in the sputtering gas deteriorates the electrical and optical performance of AZO films, which can be improved by post annealing. An optimal value of 1.0 × 10−3 Ω cm for the resistivity and 90% for the optical transmission was obtained at processing temperatures below 250 °C. Two types of thin Si heterojunction solar cells were prepared and compared using DC sputtered AZO film as the front electrode. Results show that DC sputtered AZO films meet the requirements for use as transparent front electrode in thin Si heterojunction solar cells.
Keywords :
Thin films , Sputtering , Optical properties , Electrical properties , Oxides
Journal title :
Materials Chemistry and Physics
Serial Year :
2013
Journal title :
Materials Chemistry and Physics
Record number :
1065442
Link To Document :
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