Title of article
Effect of substrates on phase formation in PMN-PT 68/32 thin films by sol–gel process
Author/Authors
P. Kumar، نويسنده , , Sonia، نويسنده , , R.K. Patel، نويسنده , , C. Prakash، نويسنده , , T.C. Goel، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2008
Pages
4
From page
7
To page
10
Abstract
PMN-PT 68/32 thin films have been prepared on Pt/Si, ITO coated glass, stainless steel and silicon substrates in the identical processing conditions by sol–gel process. Annealing temperature of 600 °C was ascertained by thermo gravimetric analysis (TGA) study of the dried sol–gel powder of PMNT-PT 68/32 composition. X-ray diffraction (XRD) study showed ∼95% perovskite phase formation on Pt/Si and ITO coated glass substrates. SEM micrographs showed the formation of sub micron size grains on Pt/Si and ITO coated glass substrates. Diffuse phase transition with transition temperature (Tc) ∼190 °C was observed in 0.8 μm thick PMN-PT 68/32 films deposited on Pt/Si and ITO coated glass substrates.
Keywords
Annealing , Coatings , Dielectric properties , Thin films
Journal title
Materials Chemistry and Physics
Serial Year
2008
Journal title
Materials Chemistry and Physics
Record number
1066036
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