Title of article :
Oriented growth of silicide and carbon in SiC-based sandwich structures with nickel
Author/Authors :
A. H?hnel، نويسنده , , V. Ischenko، نويسنده , , J. Woltersdorf، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2008
Pages :
8
From page :
303
To page :
310
Abstract :
We report on the formation kinetics and the metal-mediated structuring in nanoregions of silicide and carbon containing interlayers in SiC-based materials. The silicide formation and the graphite texturisation are determined by complex reactive diffusion processes. High resolution and analytical electron microscopy evidenced a δ-Ni2Si growth with a 〈5 0 6〉 fibre texture in parallel orientation to the 〈0 0 0 1〉 direction of the SiC substrate. The oriented growth of graphitic regions in the silicide hints to a diffusion controlled carbon precipitation from the silicide supersaturated with carbon, explaining the observed orientation relationships between graphite and silicon carbide: perpendicular and parallel to the {0 0 0 1} silicon carbide surfaces.
Keywords :
High resolution and analytical electron microscopy , Thin films , Textured growth , Nickel silicide , Silicon carbide , Graphitic carbon
Journal title :
Materials Chemistry and Physics
Serial Year :
2008
Journal title :
Materials Chemistry and Physics
Record number :
1066086
Link To Document :
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