Microwave dielectric properties of La1−xBix(Mg0.5Sn0.5)O3 ceramics

The La1−xBix(Mg0.5Sn0.5)O3 ceramics were prepared by the conventional solid-state method with various sintering temperatures. The X-ray diffraction patterns of the La0.97Bi0.03(Mg0.5Sn0.5)O3 ceramics revealed no significant variation of phase with sintering temperatures. An apparent density of 6.50 g cm−3, a dielectric constant (ɛr) of 20.2, a quality factor (Q × f) of 58,100 GHz and a temperature coefficient of resonant frequency (τf) of −84.2 ppm °C−1 were obtained for La0.97Bi0.03(Mg0.5Sn0.5)O3 ceramics that were sintered at 1550 °C for 4 h.