Title of article
Electronic parameters and top surface chemical stability of RbPb2Br5
Author/Authors
V.V. Atuchin، نويسنده , , L.I. Isaenko، نويسنده , , V.G. Kesler and N.V. Pervukhina، نويسنده , , L.D. Pokrovsky، نويسنده , , A.Yu. Tarasova، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2012
Pages
5
From page
82
To page
86
Abstract
The RbPb2Br5 crystal has been grown by Bridgman method. The electronic structure of RbPb2Br5 has been measured with XPS for a powder sample. High chemical stability of RbPb2Br5 surface is verified by weak intensity of O 1s core level recorded by XPS and structural RHEED measurements. Chemical bonding effects have been observed by the comparative analysis of element core levels and crystal structure of RbPb2Br5 and several rubidium- and lead-containing bromides using binding energy difference parameters ΔRb = (BE Rb 3d − BE Br 3d) and ΔPb = (BE Pb 4f7/2 − BE Br 3d).
Keywords
C. X-ray photo-emission spectroscopy (XPS) , D. Surface properties , A. Optical materials , A. Surfaces , C. Reflection high energy electron diffraction (RHEED) , D. Crystallography , B. Crystal Growth
Journal title
Materials Chemistry and Physics
Serial Year
2012
Journal title
Materials Chemistry and Physics
Record number
1066618
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