Title of article :
Electronic parameters and top surface chemical stability of RbPb2Br5
Author/Authors :
V.V. Atuchin، نويسنده , , L.I. Isaenko، نويسنده , , V.G. Kesler and N.V. Pervukhina، نويسنده , , L.D. Pokrovsky، نويسنده , , A.Yu. Tarasova، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2012
Abstract :
The RbPb2Br5 crystal has been grown by Bridgman method. The electronic structure of RbPb2Br5 has been measured with XPS for a powder sample. High chemical stability of RbPb2Br5 surface is verified by weak intensity of O 1s core level recorded by XPS and structural RHEED measurements. Chemical bonding effects have been observed by the comparative analysis of element core levels and crystal structure of RbPb2Br5 and several rubidium- and lead-containing bromides using binding energy difference parameters ΔRb = (BE Rb 3d − BE Br 3d) and ΔPb = (BE Pb 4f7/2 − BE Br 3d).
Keywords :
C. X-ray photo-emission spectroscopy (XPS) , D. Surface properties , A. Optical materials , A. Surfaces , C. Reflection high energy electron diffraction (RHEED) , D. Crystallography , B. Crystal Growth
Journal title :
Materials Chemistry and Physics
Journal title :
Materials Chemistry and Physics